Cart (Loading....) | Create Account
Close category search window
 

Fast removal of line scratches in old movies

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Bruni, V. ; Istituto per le Applicazioni del Calcolo, CNR, Rome, Italy ; Vitulano, D. ; Kokaram, A.

In this paper a fast algorithm for removing line scratches in old movies is presented. It is strongly based on exploiting the defect visibility in the image. To this aim the Weber's law can be applied to coefficients of an over-complete wavelet representation of the degraded image. The intensity of the defect, which is represented as a light diffraction effect, is then attenuated in the vertical and approximation sub-bands till the minimum threshold of visibility is reached. The experimental results are very satisfying: the image is completely recovered without local artifacts or annoying smoothing effects.

Published in:

Pattern Recognition, 2004. ICPR 2004. Proceedings of the 17th International Conference on  (Volume:4 )

Date of Conference:

23-26 Aug. 2004

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.