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Wide baseline matching through homographic transformation

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1 Author(s)
Elias, R. ; VIVA Res. Lab., Ottawa Univ., Ont., Canada

This work discusses the wide baseline matching problem where the camera parameters are known up to an error factor and the ground surface is considered planar. Junctions of different shapes and orientations are detected. Homographic correlation, an invariant measure to projective transformation, is utilized using reconstructed planes made of detected junctions. Two variants of homographic correlation are proposed showing that this approach outperforms non-homographic correlation.

Published in:

Pattern Recognition, 2004. ICPR 2004. Proceedings of the 17th International Conference on  (Volume:4 )

Date of Conference:

23-26 Aug. 2004

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