Cart (Loading....) | Create Account
Close category search window
 

Design of a bias magnetic system of a magnetostrictive sensor for flexural wave measurement

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Woochul Kim ; Sch. of Mech. & Aerosp. Eng., Seoul Nat. Univ., South Korea ; Young Kim, Yoon

We report on an investigation of the voltage output from a magnetostrictive sensor for the measurement of elastic flexural waves in a cylindrical steel waveguide. Since the sensor performance is strongly influenced by the bias magnetic field, the bias field optimization is one of the most critical issues in the design of magnetostrictive sensors. For a magnetic system consisting of a yoke and an electromagnet, we formulate a method for optimizing yoke topology in order to maximize the sensor output. Both linear and nonlinear magnetization relations are considered in our analysis. For the verification of the performance of the proposed sensors, we conducted several experiments involving flexural waves to assess the performance of the optimized sensors, and we analyze their results here.

Published in:

Magnetics, IEEE Transactions on  (Volume:40 ,  Issue: 5 )

Date of Publication:

Sept. 2004

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.