Cart (Loading....) | Create Account
Close category search window

Analysis of digital tries with Markovian dependency

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Jacquet, P. ; INRIA, Le Chesnay, France ; Szpankowski, W.

A complete characterization of a digital tree, also called a trie, is presented from the depth viewpoint in a Markovian framework, that is, under the assumption that symbols in a key are Markov-dependent. The main findings show that asymptotically, as the number of keys n tends to infinity, the average depth becomes EDn~(1/ h1) log N+c', and the variance is var Dn~α log n+c", where h1 is the entropy of the (Markovian-dependent) alphabet, α is a parameter of the probabilistic model and c ' and c" are constants. The symmetric independent model has α=0, hence in this case var Dn=O(1). Limiting distribution is also derived for the depth Dn, and in particular, it is shown that Dn tends to the normal distribution in all cases except the symmetric independent model. These results extend all previous analyses since most of them have been limited to independent models

Published in:

Information Theory, IEEE Transactions on  (Volume:37 ,  Issue: 5 )

Date of Publication:

Sep 1991

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.