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A fast and precise interconnect capacitive coupling noise model

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2 Author(s)
Young Jun Lee ; Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA ; Yong-Bin Kim

This paper presents an accurate and fast method for calculating the time domain crosstalk noise for finite length on-chip distributed RC interconnect line. We begin with T. Sakurai's crosstalk noise model and develop the new model by fitting the equation to HSPICE simulation data. The developed model was applied to long wires ranging from 1000 μm to 8000 μm, and the experiments in realistic environment demonstrate that the error between HSPICE simulation and the analysis using the proposed model is within ±10 percent for an 0.12 μm CMOS technology.

Published in:

Circuits and Systems, 2004. ISCAS '04. Proceedings of the 2004 International Symposium on  (Volume:2 )

Date of Conference:

23-26 May 2004