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This paper mixes two encoding techniques to reduce test data volume, test pattern delivery time and power dissipation in scan test applications. This is achieved by using the Run-Length (RL) encoding followed by Huffman encoding. This combination is especially effective when the ratio of don't cares in a test set is high which is a common case in today's large SoCs. Our analytical analysis and the experimental results on ISCAS89 benchmarks confirm that achieving 32 to 85% compression ratio and 55 to 93% power reduction is possible for scan testable SoCs.