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Mixed RL-Huffman encoding for power reduction and data compression in scan test

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4 Author(s)
Tehranipour, M.H. ; Texas Univ., Richardson, TX, USA ; Nourani, M. ; Arabi, K. ; Afzali-Kusha, A.

This paper mixes two encoding techniques to reduce test data volume, test pattern delivery time and power dissipation in scan test applications. This is achieved by using the Run-Length (RL) encoding followed by Huffman encoding. This combination is especially effective when the ratio of don't cares in a test set is high which is a common case in today's large SoCs. Our analytical analysis and the experimental results on ISCAS89 benchmarks confirm that achieving 32 to 85% compression ratio and 55 to 93% power reduction is possible for scan testable SoCs.

Published in:

Circuits and Systems, 2004. ISCAS '04. Proceedings of the 2004 International Symposium on  (Volume:2 )

Date of Conference:

23-26 May 2004

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