Cart (Loading....) | Create Account
Close category search window
 

Performance evaluation of low-density parity-check codes on partial-response channels using density evolution

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Weijun Tan ; Sch. of Electr. & Comput. Eng., Univ. of Oklahoma, Norman, OK, USA ; Cruz, J.R.

A method to evaluate the performance of a low-density parity-check (LDPC) code on partial-response (PR) channels in terms of the noise threshold and decoding error is presented. Given a particular codeword or assuming an independent and uniformly distributed (i.u.d.) codeword for transmission, the density-evolution algorithm is used to compute the probability density function of messages passing in the decoding process, from which the decoding error is extracted. This estimated i.u.d. decoding error is used to approximate the decoding error of an ensemble of LDPC codes on arbitrary PR channels. Comparison with simulation results shows that it is a very good approximation for the simulated codes, provided their length is large enough.

Published in:

Communications, IEEE Transactions on  (Volume:52 ,  Issue: 8 )

Date of Publication:

Aug. 2004

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.