InGaAlAs-InP double heterojunction bipolar transistors with continuously graded base-emitter and base-collector junctions were successively fabricated, and their DC characteristics measured. The devices exhibited a lower offset voltage (Voffset<20 mV), lower output conductance and higher collector-emitter breakdown voltage (BVCEO>13 V, BVCBO>20 V) than are typically achieved in single heterojunction InGaAlAs devices.
Published in:
Electronics Letters
(Volume:27
,
Issue:
13
)
Date of Publication: 20 June 1991