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Testing and diagnostics of CMOS circuits using light emission from off-state leakage current

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5 Author(s)
Stellari, F. ; IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA ; Song, P. ; Tsang, James C. ; McManus, M.K.
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In recent years, innovative applications based on the detection of emission sources such as the light emission from off-state leakage current (LEOSLC) of CMOS transistors have been developed for testing and diagnosing modern ultralarge-scale integration circuits. In this paper, we show that LEOSLC can be used to effectively debug circuits, localize defects with a quick turn around time, read the logic state of gates, and extract the internal voltage drop of power distribution grids among others.

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Electron Devices, IEEE Transactions on  (Volume:51 ,  Issue: 9 )