Referenced Items are not available for this document.
In recent years, innovative applications based on the detection of emission sources such as the light emission from off-state leakage current (LEOSLC) of CMOS transistors have been developed for testing and diagnosing modern ultralarge-scale integration circuits. In this paper, we show that LEOSLC can be used to effectively debug circuits, localize defects with a quick turn around time, read the logic state of gates, and extract the internal voltage drop of power distribution grids among others.
Published in:
Electron Devices, IEEE Transactions on
(Volume:51
,
Issue:
9
)
Date of Publication: Sept. 2004
- Page(s):
- 1455 - 1462
- ISSN :
- 0018-9383
- INSPEC Accession Number:
- 8085131
- Digital Object Identifier :
- 10.1109/TED.2004.833967
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 24 August 2004
- Issue Date :
- Sept. 2004
- Sponsored by :
- IEEE Electron Devices Society
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