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Highly textured  FePt:C nanocomposite thin films, deposited directly on thermally oxidized Si wafers, are obtained by multilayer deposition plus subsequent thermal annealing. Nanostructures, crystalline orientations, interactions, and magnetic properties are investigated by transmission electron microscopy (TEM), X-ray diffraction (XRD), magnetic force microscopy, and magnetic measurements. The formation of the ordered L10 phase is confirmed by XRD, and only visible (00l) peaks indicate a high degree of the  texture. TEM observation reveals that FePt grains are embedded in the C matrix and appear to be well isolated. The FePt grains are very uniform with average sizes about 5 nm.