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Thickness reduction in CoPtCr-SiO2 perpendicular recording media to improve media performance

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8 Author(s)
Shimatsu, T. ; Res. Inst. of Electr. Commun., Tohoku Univ., Sendai, Japan ; Oikawa, T. ; Inaba, Y. ; Sato, H.
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Magnetic properties and recording performance of thin CoPtCr-SiO2 media were examined in relation to thermal stability. Magnetic anisotropy Ku of {(Co90Cr10)80Pt20}89-(SiO2)11 media maintains a constant value of around 5.5×106 erg/cm3, even at film thickness of 4 nm. This Ku value corresponds to the anisotropy energy of the grains Kug calculated by taking account of the volume fraction of about 8×106 erg/cm3, indicating a high potential to resist thermal agitation. The high Ku derives a high remanence coercivity Hr of ∼4 kOe, even at film thickness of 8 nm, resulting in a loop squareness of nearly 1. The ratio of magnetic anisotropy energy to thermal energy KuVact/kT maintained a value of more than 70, even at this thickness. The media noise at low recording density increases with decreasing film thickness below 8 nm, probably due to the thermal agitation. The recording resolution D50 showed a broad maximum of ∼420 kFCI at around this thickness. The reduction in film thickness improves recording resolution; however, it is likely that the large thermal agitation in the thin-film region degrades the recording resolution, resulting in an optimum thickness to show the highest recording resolution.

Published in:

Magnetics, IEEE Transactions on  (Volume:40 ,  Issue: 4 )

Date of Publication:

July 2004

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