By Topic

Hazard characterization of basic Boolean functions

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Krad, H. ; New Orleans Univ., LA, USA

The author presents a method to verify the dynamic behavior of Boolean functions and characterize hazards associated with them. This technique makes it possible to uniformly detect hazards associated with two-level combinational circuits. Specifically, the dynamic behavior of the basic Boolean functions AND, OR, and NOT is considered, and a theorem for the intrinsic AND-function (IAF) hazard is proved. Three corollaries for three different versions of the IAF hazard are given, and a theorem for the intrinsic OR-function (IOF) hazard is proved. Three corollaries for three different versions of the IOF hazard are also given, and the basic Boolean function NOT is shown to be hazard-free. This method lends itself to a rule-based characterization that can be easily automated

Published in:

Southeastcon '89. Proceedings. Energy and Information Technologies in the Southeast., IEEE

Date of Conference:

9-12 Apr 1989