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Fault diagnosis in a class of concurrent discrete event systems

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4 Author(s)
Ukawa, Y. ; Graduate Sch. of Eng. Sci., Osaka Univ., Japan ; Ushio, T. ; Takai, S. ; Yamamoto, S.

In this paper, we consider diagnosability of discrete event systems with simultaneous event occurrences, which we call concurrent discrete event systems. The systems have a problem that the number of event sets, which may occur concurrently, is increasing exponentially. So, it is difficult to design a diagnoser. We introduce a notion of concurrent well-posedness (CWP). We then prove that CWP is a necessary and sufficient condition for no effect of concurrency on the diagnosability in concurrent discrete event systems.

Published in:

SICE 2003 Annual Conference  (Volume:3 )

Date of Conference:

4-6 Aug. 2003