By Topic

Coupling of simultaneous switching noise to interconnecting lines in high-speed systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Jingook Kim ; Dept of Electr. Eng. & Comput. Sci., KAIST, Daejon, South Korea ; M. D. Rotaru ; Kok Chin Chong ; Jongbae Park
more authors

An analytical model of the coupling mechanism between the switching noises to signal traces has been successfully derived. The coupling mechanism was been rigorously analyzed and clarified. The analytical model was verified up to 10 GHz by comparison with measured results and simulated results using a full wave simulator (HFSS). It has also been successfully applied to applications like the current memory modules (SDRAM DDR module).

Published in:

Electronic Components and Technology Conference, 2004. Proceedings. 54th  (Volume:1 )

Date of Conference:

1-4 June 2004