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Theoretical and experimental study on junction temperature of packaged Fabry-Perot laser diode

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2 Author(s)
Jae-Ho Han ; Fiber Opt. & Telecommun. Res. Lab., LG Cable, Anyang, South Korea ; Park, S.W.

Characterization of laser diode at high temperature for the issue of long-term reliability to detect and screen the initial failures originated from internal stress and optical instability is performed. Estimation of junction temperature of 1.55 μm Fabry-Perot laser diode was theoretically approached by using thermal resistance of materials regarding the heat path from analytically modeling laser diode. Under the condition of burn-in test, experiments measuring the junction temperature with current injection at controlled temperature verify the result compared to that of analysis.

Published in:

Device and Materials Reliability, IEEE Transactions on  (Volume:4 ,  Issue: 2 )

Date of Publication:

June 2004

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