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Interconnect coupling-aware driver modeling in static noise analysis for nanometer circuits

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4 Author(s)
Xiaoliang Bai ; Dept. of Electr. & Comput. Eng., California Univ., San Diego, La Jolla, CA, USA ; Chandra, R. ; Dey, S. ; Srinivas, P.V.

With geometries shrinking in nanometer technologies, crosstalk noise becomes a critical issue. Modern designs like system-on-chips have millions of noise-prone nodes, mandating fast yet accurate crosstalk noise analysis techniques. Using linear circuit model, static noise analysis can efficiently estimate crosstalk noise. Traditionally in static noise analysis, drivers' holding resistances are precharacterized without considering the potential impact of crosstalk noise. However, crosstalk induced voltage fluctuation strongly affects the behavior of nonlinear drivers. When facing different coupling interconnects and hence crosstalk noise, a driver's holding resistance can change dramatically. In nanometer circuits, this substantial variation of nonlinear drivers cannot be totally ignored. To achieve high-quality in noise estimation yet maintain the efficiency of linear circuit model, we propose a novel interconnect coupling-aware driver modeling method. Based on layout-extracted interconnect parameters and precharacterized driver models, an effective holding resistance is calculated to capture the impact of the nonlinear driver. Multiple aggressors with synchronous and asynchronous switching activities are also considered. The proposed method is simple, efficient, and enables on-the-fly calculation of the effective holding resistance. Experiments show that with negligible computation overhead, the coupling-aware driver modeling methodology can significantly improve the quality of static noise analysis.

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:23 ,  Issue: 8 )