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Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC

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3 Author(s)
Pouget, V. ; UMR CNRS, Univ. Bordeaux, Talence, France ; Lewis, D. ; Fouillat, P.

This paper presents an experimental system for integrated circuit testing with a pulsed laser beam. The system is fully automated and simultaneously provides interesting spatial and temporal resolutions for various applications like fault injection, radiation sensitivity evaluation, or default localization. In the presented application, the system is used to visualize signal propagation in an 8-bit half-flash analog-to-digital converter.

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Instrumentation and Measurement, IEEE Transactions on  (Volume:53 ,  Issue: 4 )