Referenced Items are not available for this document.
This paper presents an experimental system for integrated circuit testing with a pulsed laser beam. The system is fully automated and simultaneously provides interesting spatial and temporal resolutions for various applications like fault injection, radiation sensitivity evaluation, or default localization. In the presented application, the system is used to visualize signal propagation in an 8-bit half-flash analog-to-digital converter.
Published in:
Instrumentation and Measurement, IEEE Transactions on
(Volume:53
,
Issue:
4
)
Date of Publication: Aug. 2004
- Page(s):
- 1227 - 1231
- ISSN :
- 0018-9456
- INSPEC Accession Number:
- 8121810
- Digital Object Identifier :
- 10.1109/TIM.2004.831488
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 19 July 2004
- Issue Date :
- Aug. 2004
- Sponsored by :
- IEEE Instrumentation and Measurement Society
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