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Configurable two-dimensional linear feedback shifter registers for parallel and serial built-in self-test

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2 Author(s)
Chen, C.-I.H. ; Dept. of Electr. Eng., Wright State Univ., Dayton, OH, USA ; George, K.

A configurable two-dimensional (2-D) LFSR based test generator and an automated synthesis procedure are presented. Without storage of test patterns, a 2-D LFSR based test pattern generator can generate a sequence of precomputed test patterns (detecting random-pattern-resistant faults) and followed by random patterns (detecting random-pattern-detectable faults). The hardware overhead is decreased considerably through configuration. The configurable 2-D LFSR test generator can be adopted in two basic BIST execution options: test-per-clock (parallel BIST) and test-per-scan (serial BIST). Experimental results of test-per-clock and test-per-scan BIST of benchmark circuits demonstrate the effectiveness of the proposed technique. The configurable 2-D LSFR can also be adopted in chip-level and system-on-a-chip (SoC) BIST.

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Instrumentation and Measurement, IEEE Transactions on  (Volume:53 ,  Issue: 4 )