By Topic

A variational approach for Bayesian blind image deconvolution

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Likas, C.L. ; Dept. of Comput. Sci., Univ. of Ioannina, Greece ; Galatsanos, N.P.

In this paper, the blind image deconvolution (BID) problem is addressed using the Bayesian framework. In order to solve for the proposed Bayesian model, we present a new methodology based on a variational approximation, which has been recently introduced for several machine learning problems, and can be viewed as a generalization of the expectation maximization (EM) algorithm. This methodology reaps all the benefits of a "full Bayesian model" while bypassing some of its difficulties. We present three algorithms that solve the proposed Bayesian problem in closed form and can be implemented in the discrete Fourier domain. This makes them very cost effective even for very large images. We demonstrate with numerical experiments that these algorithms yield promising improvements as compared to previous BID algorithms. Furthermore, the proposed methodology is quite general with potential application to other Bayesian models for this and other imaging problems.

Published in:

Signal Processing, IEEE Transactions on  (Volume:52 ,  Issue: 8 )