Cart (Loading....) | Create Account
Close category search window
 

Improving data locality by array contraction

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Yonghong Song ; Sun MicroSystems Inc., Santa Clara, CA, USA ; Rong Xu ; Cheng Wang ; Zhiyuan Li

Array contraction is a program transformation which reduces array size while preserving the correct output. In this paper, we present an aggressive array-contraction technique and study its impact on memory system performance. This technique, called controlled SFC, combines loop shifting and controlled loop fusion to maximize opportunities for array contraction within a given loop nesting. A controlled fusion scheme is used to prevent overfusing loops and to avoid excessive pressure on the cache and the registers. Reducing the array size increases data reuse because of the increased average number of memory operations on the same memory addresses. Furthermore, if the data size of a loop nest fits in the cache after array contraction, then repeated references to the same variable in the loop nest generate cache hits, assuming set conflicts are eliminated successfully.

Published in:

Computers, IEEE Transactions on  (Volume:53 ,  Issue: 9 )

Date of Publication:

Sept. 2004

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.