Referenced Items are not available for this document.
With the ongoing technology downscaling transient latch-up (TLU) becomes increasingly important. There is a common understanding that TLU is even a higher risk than the static LU. The comprehensive TLU analysis of three different products in combination with detailed failure analysis and TCAD simulations have been presented in this paper.
Published in:
Reliability Physics Symposium Proceedings, 2004. 42nd Annual. 2004 IEEE International
Date of Conference: 25-29 April 2004
- Page(s):
- 370 - 374
- Print ISBN:
- 0-7803-8315-X
- INSPEC Accession Number:
- 7995315
- Digital Object Identifier :
- 10.1109/RELPHY.2004.1315354
- Product Type:
- Conference Publications
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