Cart (Loading....) | Create Account
Close category search window
 

Spatial distribution of intensity noise in vertical cavity surface emitting lasers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Romanelli, M. ; Laboratoire Kastler Brossel, Univ. Pierre et Marie Curie, Paris, France ; Maurin, I. ; Hermier, J.-P. ; Bramati, A.
more authors

The anticorrelated quantum fluctuations of the two lasing modes of a VCSEL is studied. The behaviour of the fluctuations of TEM00 and TEM01 transverse modes and their correlation is investigated by measuring the transverse spatial distribution of intensity noise of the laser beam. Results are compared with predictions of a full quantum model which include the transverse structure of the lasing modes as well as the spatial correlations created by the competition of different transverse modes. The model includes a spatial dependence of the pump and allows for the simultaneous lasing of two transverse modes. The quantum fluctuations are calculated from the Heisenberg Langevin equations of the system.

Published in:

Quantum Electronics Conference, 2003. EQEC '03. European

Date of Conference:

22-27 June 2003

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.