Cart (Loading....) | Create Account
Close category search window
 

High resolution spectroscopy of a single trapped ion

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Schwedes, Ch. ; Max-Planck-Inst. fur Quantenoptik, Garching, Germany ; Eckle, P. ; Eichenseer, M. ; Nevsky, A.Yu.
more authors

Excitation of the 3P0 state is detected in optical-optical double resonance via the dark periods in the fluorescence on the fast 1S0 3P1 transition. The dye laser formerly used to excite this line was recently replaced by a diode-based laser system: a grating stabilized diode at 922 nm, further frequency stabilized onto a Fabry-Perot interferometer, is seeded into a tapered amplifier. Subsequent frequency-quadrupling employing a periodically poled KTP and a BBO crystal, each placed in an external enhancement cavity, leads to the right frequency at 231 nm. For the 1S0 3P0 transition a resolution of 1.3 × 10-13 has been achieved so far, limited by the frequency instability of the Nd:YAG laser. The short-term frequency stability of this laser has been strongly improved recently. With a new laser setup a linewidth < 5 Hz (FWHM) for integration times ×30 s has been achieved using active vibration isolation platforms for the reference cavity. Recent progress of that work is reported.

Published in:

Quantum Electronics Conference, 2003. EQEC '03. European

Date of Conference:

22-27 June 2003

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.