Cart (Loading....) | Create Account
Close category search window
 

Techniques to reduce the soft error rate of a high-performance microprocessor

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Weaver, C. ; Massachusetts Microprocessor Design Center, Intel Corp., Hudson, MA, USA ; Emer, J. ; Mukherjee, S.S. ; Reinhardt, S.K.

Transient faults due to neutron and alpha particle strikes pose a significant obstacle to increasing processor transistor counts in future technologies. Although fault rates of individual transistors may not rise significantly, incorporating more transistors into a device makes that device more likely to encounter a fault. Hence, maintaining processor error rates at acceptable levels will require increasing design effort. This paper proposes two simple approaches to reduce error rates and evaluates their application to a microprocessor instruction queue. The first technique reduces the time instructions sit in vulnerable storage structures by selectively squashing instructions when long delays are encountered. A fault is less likely to cause an error if the structure it affects does not contain valid instructions. We introduce a new metric, MITF (Mean Instructions To Failure), to capture the trade-off between performance and reliability introduced by this approach. The second technique addresses false detected errors. In the absence of a fault detection mechanism, such errors would not have affected the final outcome of a program. For example, a fault affecting the result of a dynamically dead instruction would not change the final program output, but could still be flagged by the hardware as an error. To avoid signalling such false errors, we modify a pipeline's error detection logic to mark affected instructions and data as possibly incorrect rather than immediately signaling an error. Then, we signal an error only if we determine later that the possibly incorrect value could have affected the program's output.

Published in:

Computer Architecture, 2004. Proceedings. 31st Annual International Symposium on

Date of Conference:

19-23 June 2004

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.