By Topic

Scanning differential spreading resistance microscopy on actively driven buried heterostructure multiquantum-well lasers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
D. Ban ; Dept. of Electr. & Comput. Eng., Univ. of Toronto, Ont., Canada ; E. H. Sargent ; St. J. Dixon-Warren

We have developed a new scanning probe microscopy-based technique, scanning differential spreading resistance microscopy (SDSRM), which enables the determination of free carrier distribution inside operating electronic and optoelectronic devices. The results of our SDSRM study of multiquantum-well (MQW) buried heterostructure (BH) lasers under zero and forward biases are reported. Individual QW-barrier layers can be resolved in high-resolution SDSRM. The SDSRM results show different internal carrier distribution within the MQW active region in BH lasers with and without biases and provide direct experimental evidence of electron overbarrier leakage. Our results demonstrate the utility of SDSRM to delineate quantitatively the transverse cross-sectional structure of complex two-dimensional devices such as MQW BH lasers under operating conditions, in which traditional probing such as secondary ion mass spectroscopy, scanning spreading resistance microscopy, and electron beam-induced current microscopy can either apply only to devices under zero bias or provide only qualitative pictures.

Published in:

IEEE Journal of Quantum Electronics  (Volume:40 ,  Issue: 7 )