Cart (Loading....) | Create Account
Close category search window
 

Biorthogonal wavelet system for high-resolution image reconstruction

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Lixin Shen ; Dept. of Math., West Virginia Univ., Morgantown, WV, USA ; Qiyu Sun

High-resolution images are often desired but made impossible because of hardware limitations. For the high-resolution model proposed by Bose and Boo (see Int. J. Imaging Syst. Technol., vol.9, p.294-304, 1998), the iterative wavelet-based algorithm has been shown to perform better than the traditional least square method when the resolution ratio M is two and four. In this paper, we discuss the minimally supported biorthogonal wavelet system that comes from the mathematical model by Bose and Boo and propose a wavelet-based algorithm for arbitrary resolution ratio M≥2. The numerical results indicate that the algorithm based on our biorthogonal wavelet system performs better in high-resolution image reconstruction than the wavelet-based algorithm in the literature, as well as the common-used least square method.

Published in:

Signal Processing, IEEE Transactions on  (Volume:52 ,  Issue: 7 )

Date of Publication:

July 2004

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.