Cart (Loading....) | Create Account
Close category search window
 

Shared information and program plagiarism detection

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Xin Chen ; Dept. of Comput. Sci., Univ. of California, Riverside, CA, USA ; Francia, B. ; Ming Li ; McKinnon, B.
more authors

A fundamental question in information theory and in computer science is how to measure similarity or the amount of shared information between two sequences. We have proposed a metric, based on Kolmogorov complexity, to answer this question and have proven it to be universal. We apply this metric in measuring the amount of shared information between two computer programs, to enable plagiarism detection. We have designed and implemented a practical system SID (Software Integrity Diagnosis system) that approximates this metric by a heuristic compression algorithm. Experimental results demonstrate that SID has clear advantages over other plagiarism detection systems. SID system server is online at http://software.bioinformatics.uwaterloo.ca/SID/.

Published in:

Information Theory, IEEE Transactions on  (Volume:50 ,  Issue: 7 )

Date of Publication:

July 2004

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.