Scheduled System Maintenance:
On Monday, April 27th, IEEE Xplore will undergo scheduled maintenance from 1:00 PM - 3:00 PM ET (17:00 - 19:00 UTC). No interruption in service is anticipated.
By Topic

On optimization for security and reliability of power systems with distributed generation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Greatbanks, J.A. ; Dept. of Electr. & Electron. Eng., Imperial Coll., London, UK ; Popovic, D.H. ; Begovic, M. ; Pregelj, A.
more authors

Electricity market restructuring and supra-national agreements on the reduction of global greenhouse gas emissions have paved the way for an increase in the use of distributed generation - the connection of generation to the lower voltage power system. This paper formulates and discusses a methodology for the optimal siting and sizing of distributed generation a security constrained system can accept. Optimal siting is determined by sensitivity analysis of the power flow equations. The sizing method for a set of loading conditions, generation penetration level and power factor is formulated as a security constrained optimization problem. The information on optimal generation sites is used further to optimize system reliability assessed via reliability indices calculation. A genetic algorithm is designed to solve for optimal recloser positions when distributed generators are deployed in a securely optimal manner.

Published in:

Power Tech Conference Proceedings, 2003 IEEE Bologna  (Volume:1 )

Date of Conference:

23-26 June 2003