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An improved microwave procedure for detecting defects in dielectric structures is proposed. The procedure is based on the integral equations of the inverse scattering problem. A hybrid genetic algorithm (GA) is applied in order to minimize the obtained nonlinear functional. Since in nondestructive evaluations the unperturbed object is completely known, it is possible off-line to numerically compute the Green's function for the configuration without defects. Consequently, a very significant computation saving is obtained, since the "chromosome" of the GA codes only the parameters describing the unknown defect.