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The optical form birefringence in porous silicon films is measured by analyzing the transmitted interference intensity of a polarization interferometer. A novel form birefringence model called "boundary condition (BC) model" for porous materials is introduced and evaluated experimentally against samples of porous silicon films. The variation of optical indexes of refraction vs the porosity in silicon films agrees with the calculated values of no/ne within 1% error using the BC model, in contrast to the ∼15% error using effective medium approximation model.
Date of Publication: June 2004