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Integrated system design, analysis and database-driven simulation model generation

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2 Author(s)
Ki-Young Jeong ; United Technol. Res. Center, East Hartford, CT, USA ; Allan, D.

This paper discusses an integrated framework of IDEF methods for generating a common data model usable for discrete manufacturing systems. From this data model, a simulation model is automatically generated using a database-driven and atom-based approach. A case study has been included to demonstrate the concept. A prototype function model, a data model and the resulting simulation model were constructed to show the feasibility of the approach. The concept and guidelines provided are expected to increase knowledge reusability between IDEF methods and improve simulation model reusability and maintainability through the features of the relational database technologies. Although the case study was performed for a semiconductor manufacturer, this concept can be easily extended to other areas.

Published in:

Simulation Symposium, 2004. Proceedings. 37th Annual

Date of Conference:

18-22 April 2004