By Topic

General testers for asynchronous circuits

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Negulescu, R. ; Dept. of Electr. & Comput. Eng., McGill Univ., Montreal, Que., Canada

We consider the problem of testing asynchronous systems in a way that maximizes the options for test implementation and application. We prove that all testers that distinguish between healthy and faulty versions of the device under test refine a most general tester (MGT) derived from specifications of the device under test, the fault models, and the symptoms (verdicts). We show that our approach applies for circuits with non-determinism (such as arbiters) and constrained environments (rejection of invalid inputs). We give examples of fixed linear test patterns, adaptive tree-like test strategies, cyclic and non-deterministic testers, all refining their MGTs. We also demonstrate our approach for tests in which illegal signal transitions are observed, tests in which deadlock is observed, and tests in which a large persistent supply current is observed.

Published in:

Asynchronous Circuits and Systems, 2004. Proceedings. 10th International Symposium on

Date of Conference:

19-23 April 2004