By Topic

Why are nonlinear microwave systems measurements so involved?

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Rolain, Y. ; Electr. Meas. Dept., Vrije Univ. Brussel, Belgium ; Van Moer, W. ; Vandersteen, G. ; Schoukens, Johan

Performing nonlinear measurements on microwave devices is a complex task. This paper introduces, step by step, the key concepts that make the difference between linear S-parameter measurements and nonlinear measurements. The main goal here is to make nonlinear measurements more accessible to the practicing microwave engineer.

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:53 ,  Issue: 3 )