IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Conference Publications > Lasers and Electro-Optics, 20 ... Help

Simulation of dynamic performances of 1300 nm GaInNAs, AlGaInAs and InGaAsP MQW lasers

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Yong, J.C.L. ; Dept. of Electr. & Electron. Eng., Bristol Univ., UK ; Rorison, J.M. ; Williams, K.A.

The dynamic performances of 1300 nm MQW GaInNAs, AlGaInAs and InGaAsP lasers under small signal and large signal modulation are simulated and compared at room temperature and high temperature to evaluate their potential as laser sources for high-speed uncooled applications.

Published in:
Lasers and Electro-Optics, 2003. CLEO '03. Conference on

Date of Conference: 6-6 June 2003

Print ISBN:
1-55752-748-2
INSPEC Accession Number:
8158665
Conference Location :
Baltimore, MD, USA
Product Type:
Conference Publications

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.