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Wafer scale profiling of photonic integrated circuits

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3 Author(s)
J. A. Hudgings ; Phys. Dept., Mount Holyoke Coll., South Hadley, MA, USA ; K. P. Pipe ; R. J. Ram

We demonstrate a thermal profiling technique for wafer-scale testing of optical distribution in photonic integrated circuits. The technique is used to quantify the absorption coefficient of a subthreshold diode laser for varying operating conditions.

Published in:

Lasers and Electro-Optics, 2003. CLEO '03. Conference on

Date of Conference:

6-6 June 2003