Close category search window
 

Generic obstacle detection on roads by dynamic programming for remapped stereo images to an overhead view

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Kiyong Lee ; Industrial Eng. Dept., Chonnam Nat. Univ., Gwangju, South Korea ; Joonwoong Lee

This paper proposes an approach to extract generic obstacles on roads using remapped stereo images to an overhead view. The proposed approach uses the fact that the information of road surface on the remapped image is distorted by an obstacle, and formulates the generic obstacle detection (GOD) problem as a dynamic programming (DP), which contributes to search for corresponding peaks on polar histograms constructed by vertical edge components of the remapped stereo images. The corresponding peaks determine the estimates of obstacles' positions. The approach has features that it is not largely affected by intensity difference between a pair of stereo images and does not depend on the typical stereo matching, and identifies the obstacle's position quite well.

Published in:
Networking, Sensing and Control, 2004 IEEE International Conference on  (Volume:2 )

Date of Conference: 2004

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.