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Measurement of noise source impedance of SMPS using a two probes approach

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2 Author(s)
Kye Yak See ; Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore ; Junhong Deng

A novel approach to determine common-mode (CM) and differential-mode (DM) noise source impedances of a low-power switched mode power supply (SMPS) has been developed using a two current probes approach. The proposed approach allows measurement of noise source impedance of a SMPS without interrupting its normal operation. With proper setup calibration, the proposed approach can derive an equivalent circuit model, consisting of resistive and reactive components, to represent the noise source impedance with reasonable accuracy. Once the equivalent circuit model of the noise source impedance is obtained through the measurement, the most effective filter configuration and suitable component values for the built-in power line electromagnetic interference (EMI) filter of the SMPS could be designed with ease.

Published in:

Power Electronics, IEEE Transactions on  (Volume:19 ,  Issue: 3 )