By Topic

Randomized test case generation for hybrid systems: metric selection

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Esposito, J.M. ; Weapons & Syst. Eng., US Naval Acad., Annapolis, MD, USA

We are developing a randomized approach to test generation for hybrid systems, and control systems in general, using techniques from robotic path planning which have proved successful in solving high dimensional nonlinear problems. A critical component of the proposed algorithm is the choice of "metric" - how one decides the closeness of two states - which is nontrivial in the hybrid state space. In this paper we introduce four metrics for hybrid systems; and benchmark the algorithm using each of these metrics on a popular example problem from the literature and compare the impact of metric choice on computational efficiency.

Published in:

System Theory, 2004. Proceedings of the Thirty-Sixth Southeastern Symposium on

Date of Conference: