Cart (Loading....) | Create Account
Close category search window
 

High resolution mapping of nonlinear MHz ultrasonic fields using a scanned scatterer

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Kaczkowski, P. ; Appl. Phys. Lab., Washington Univ., Seattle, WA, USA ; Cunitz, B. ; Khokhlova, V. ; Sapozhnikov, O.

We show that a 2 MHz HIFU field can be measured in water and with high spatial resolution by placing a small scatterer in the field and sensing the scattered wave. We use a bistatic configuration placing a hydrophone at a safe distance. Glass and steel tips are fabricated using simple techniques and evaluated. Tapered tip geometry proves to be mechanically robust and not prone to internal resonance or scattering from other sites than the tip. Glass proves to be superior to polished carbide steel in its ability to delay the initiation of cavitation, and relatively easy to manufacture using common pipette drawing technology. In our tests, a highly nonlinear 2 MHz HIFU field is mapped in degassed water with a 0.1 mm glass tip. The fundamental, 2nd, 3rd, and 4th harmonics are mapped with at least 25 dB dynamic range and are comparable with numerical results. Numerical simulations for nonlinear fields in water are obtained using a well established KZK equation based calculation.

Published in:

Ultrasonics, 2003 IEEE Symposium on  (Volume:1 )

Date of Conference:

5-8 Oct. 2003

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.