Cart (Loading....) | Create Account
Close category search window

Full-vector analysis of photonic crystal fibers using the boundary element method

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Wang, X.Y. ; Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore ; Lou, J.J. ; Shum, P. ; Zhao, C.L.
more authors

Full-vector numerical analysis is crucial for modeling photonic crystal fiber (PCF) accurately. Based on a full-vector boundary element method (BEM), the behavior of index guiding PCF also known as Holey Fiber (HF) is accurately analyzed. The basic formulation of boundary element method is introduced. The simulation results such as root-searching results and field plots are presented. The confinement loss is evaluated by calculating the complex effective index of HF. The total dispersion of HF is also calculated. Finally, the birefringence of HF is analyzed using BEM.

Published in:

Information, Communications and Signal Processing, 2003 and Fourth Pacific Rim Conference on Multimedia. Proceedings of the 2003 Joint Conference of the Fourth International Conference on  (Volume:2 )

Date of Conference:

15-18 Dec. 2003

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.