Cart (Loading....) | Create Account
Close category search window

Three and four-dimensional parity-check codes for correction and detection of multiple errors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Anne, N.B. ; Dept. of Electr. & Comput. Eng., Nevada Univ., Las Vegas, NV, USA ; Utthaman Thirunavukkarasu ; Latifi, S.

We examine two different schemes of three dimensional parity checking codes that can be obtained by arranging the information and parity bits as a combination of rows and columns or by arranging them as two dimensional planes to obtain a three dimensional cube. Finding the number of errors detected and the numbers of errors corrected has been the main aim of this work. The code rate and the overhead of each scheme has been calculated and compared with that of the standard parity schemes available. Some general equations have been derived to represent these families of codes. A four dimensional scheme that can detect and correct more multiple errors has also been discussed.

Published in:

Information Technology: Coding and Computing, 2004. Proceedings. ITCC 2004. International Conference on  (Volume:2 )

Date of Conference:

5-7 April 2004

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.