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A statistical approach to derive an electrical port model of capacitively coupled interconnects

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2 Author(s)
Maffezzoni, P. ; Dipt. di Elettronica e Informazione, Politecnico di Milano, Milan, Italy ; Brambilla, A.

This paper considers the derivation of an electrical model at the input/output ports of a generic system of nonparallel interconnects that can be employed to simulate cross talk and delay effects through a conventional SPICE-like simulator. Only capacitive coupling effects are considered. The equivalent model of the interconnects system is determined through an iterative procedure based on the contemporary adoption of the floating random walk method that estimates the grounding and coupling capacitances per unit length and the Picard-Carson procedure that determines the entries of the transmission-matrix (T-matrix) representation at the electrical ports. It is shown that the entries of the T matrix can be efficiently computed through Monte Carlo integration.

Published in:

Circuits and Systems I: Regular Papers, IEEE Transactions on  (Volume:51 ,  Issue: 4 )

Date of Publication:

April 2004

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