Cart (Loading....) | Create Account
Close category search window
 

Efficient technique for 3-D finite element analysis of skin effect in current-carrying conductors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Hong-Kyu Kim ; Korea Electrotechnol. Res. Inst., Changwon, South Korea ; Jin-Kyo Jung ; Kyong-Yop Park ; Chang-Hwan Im
more authors

In this paper, an efficient method for the three-dimensional (3-D) computation of steady-state skin effect problems in current-carrying conductors is presented. It is assumed that the total current is composed of the source current and eddy current, and source current density is proportional to the precalculated electric field intensity. The additional variable is the proportional coefficient which is constant for one conductor. To calculate the magnetic vector potential and the proportional coefficient, the iterative procedure is employed. The proposed method requires much less computational resource and can be easily implemented in the existing 3-D finite element code with slight modification. The method is validated by comparison to known solutions of slot-embedded model and applied to the analysis of current distribution in the GIS conductors.

Published in:

Magnetics, IEEE Transactions on  (Volume:40 ,  Issue: 2 )

Date of Publication:

March 2004

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.