Cart (Loading....) | Create Account
Close category search window
 

Performance evaluation of MMP-II:A second-generation small animal PET

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Correia, J.A. ; Dept. of Radiol., Massachusetts Gen. Hosp.& Harvard Med. Sch., Boston, MA, USA ; Burnham, C.A. ; Kaufman, D. ; Brownell, A.-L.
more authors

We have completed construction of a second-generation, single-plane small animal PET instrument based on LSO detectors. The second-generation design addresses some of the limitations in the first-generation. The purpose of the work reported here was to characterize the physical performance of this instrument. Results of the performance measurements include: Spatial resolution=1.25 mm at field center and 1.5 mm at 2 cm radius; point source sensitivity=56 cps/uCi,; scatter fractions of 0.019 and 0.056 in 3.8 and 6 cm diameter cylinders respectively; linearity of reconstructed signal within 5% up to 100 uCi/cc and acceptable dead-time performance up to 25 k true cps. Examples of phantom and animal images are also presented.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:51 ,  Issue: 1 )

Date of Publication:

Feb. 2004

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.