By Topic

Trading off transient fault tolerance and power consumption in deep submicron (DSM) VLSI circuits

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Maheshwari, A. ; Interconnect Circuit Design Group, Univ. of Massachusetts, Amherst, MA, USA ; Burleson, W. ; Tessier, R.

High fault tolerance for transient faults and low-power consumption are key objectives in the design of critical embedded systems. Systems like smart cards, PDAs, wearable computers, pacemakers, defibrillators, and other electronic gadgets must not only be designed for fault tolerance but also for ultra-low-power consumption due to limited battery life. In this paper, a highly accurate method of estimating fault tolerance in terms of mean time to failure (MTTF) is presented. The estimation is based on circuit-level simulations (HSPICE) and uses a double exponential current-source fault model. Using counters, it is shown that the transient fault tolerance and power dissipation of low-power circuits are at odds and allow for a power fault-tolerance tradeoff. Architecture and circuit level fault tolerance and low-power techniques are used to demonstrate and quantify this tradeoff. Estimates show that incorporation of these techniques results either in a design with an MTTF of 36 years and power consumption of 102 /spl mu/W or a design with an MTTF of 12 years and power consumption of 20 /spl mu/W. Depending on the criticality of the system and the power budget, certain techniques might be preferred over others, resulting in either a more fault tolerant or a lower power design, at the sacrifice of the alternative objective.

Published in:

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on  (Volume:12 ,  Issue: 3 )