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Assessing software costs money and better assessment costs exponentially more money. Given finite budgets, assessment resources are typically skewed towards areas that are believed to be mission critical. This leaves blind spots: portions of the system that may contain defects which may be missed. Therefore, in addition to rigorously assessing mission critical areas, a parallel activity should sample the blind spots. This paper assesses defect detectors based on static code measures as a blind spot sampling method. In contrast to previous results, we find that such defect detectors yield results that are stable across many applications. Further, these detectors are inexpensive to use and can be tuned to the specifics of the current business situations.
Date of Conference: 25-26 March 2004