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Compendia of TID and SEE test results of space qualified integrated circuits

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7 Author(s)
Layton, P. ; Maxwell Technol., San Diego, CA, USA ; Williamson, G. ; Patnaude, E. ; Longden, L.
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SEE and TID data taken for existing and potential space products is presented. The data was collected to evaluate these devices for radiation effects in space environments.

Published in:

Radiation Effects Data Workshop, 2003. IEEE

Date of Conference:

21-25 July 2003

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