Referenced Items are not available for this document.
16-bit analog-to-digital (A/D) converters were evaluated for performance and linearity degradation due to the total dose induced shifts in the voltage reference. Test data and analysis of three A/D converters is presented.
Published in:
Radiation Effects Data Workshop, 2003. IEEE
Date of Conference: 21-25 July 2003
- Page(s):
- 6 - 10
- Print ISBN:
- 0-7803-8127-0
- INSPEC Accession Number:
- 8023970
- Digital Object Identifier :
- 10.1109/REDW.2003.1281314
- Product Type:
- Conference Publications
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