By Topic

TID performance degradation of high precision, 16-bit analog-to-digital converters

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Layton, P. ; Maxwell Technol., San Diego, CA, USA ; Williamson, G. ; Patnaude, E. ; Longden, L.
more authors

16-bit analog-to-digital (A/D) converters were evaluated for performance and linearity degradation due to the total dose induced shifts in the voltage reference. Test data and analysis of three A/D converters is presented.

Published in:

Radiation Effects Data Workshop, 2003. IEEE

Date of Conference:

21-25 July 2003