By Topic

Low noise, large area CMOS x-ray image sensor for C.T. application

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Kemna, A. ; Fraunhofer Inst. for. Microelectron. Circuits & Syst., Duisburg, Germany ; Brockherde, W. ; Hosticka, B. ; Ozkan, E.
more authors

In this paper, we describe a novel CMOS X-ray active pixel sensor for indirect C.T. X-ray detection. Considerable noise reduction has been achieved by lowering the detector junction capacitance. For this purpose a new low capacitance, low dark current dot type photodiode based on minority diffusion has been developed. The dynamic range is expanded to 17 bit by the use of individual in-pixel automatic gain control. A photon noise limited detector exhibiting a 20 × 10 pixel array with a frame rate of 3000 frames/sec has been realized in a 1.2 μm CMOS process.

Published in:

Sensors, 2003. Proceedings of IEEE  (Volume:2 )

Date of Conference:

22-24 Oct. 2003